Scanning Electron Microscope - FEI Inspect S 50

MEV Inspect.jpg

Manufacturer and model: FEI Inspect S 50

Description: The FEI Inspect S50 is a versatile tungsten filament SEM. The analyzes in this SEM can be performed in either high vacuum or low vacuum, which allows imaging without loading non-conductive samples. The FEI Inspect S50 has EDS (Energy Dispersive X-ray Spectroscopy) detectors for chemical microanalysis that allow quantification and chemical mapping. In addition, this SEM also has an EBSD (Electron Back Scattered Diffraction) system that allows the mapping of the crystallographic orientation of the surface of the samples. 

Acquisition funding: FAPESP

Location: Structural Characterization Laboratory (LCE)/DEMa

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