Materials Characterization

Atomic Force Microscope - Bruker Multimode 8

Benchtop Scanning Electronic Microscope (SEM)

Complete ASTAR system for orientation and phase mapping

Confocal Microscope

Energy Dispersive X-ray Fluorescence Spectrometer

Fourier-transform infrared (FT-IR) spectrometer

Parallel plates rheometer - controlled stress

Scanning Electron Microscope - FEI Inspect S 50

Scanning Electron Microscope - Philips XL-30 FEG

Scanning Electron Microscope - Philips XL-30 TMP

Scanning Electron Microscope - FEI Magellan 400 L

Transmission Electron Microscope - FEI TECNAI G2 S-TWIN

Transmission Electron Microscope - FEI TECNAI G² F20 HRTEM

Transmission Electron Microscope - Philips CM-120

X-ray diffractometer (XRD) with small area accessory

X-ray Diffractometer - Bruker D8 Advance ECO

X-ray Diffractometer - Rigaku Geiger-Flex

X-ray Diffractometer - Siemens D5005

X-ray fluorescence (XRF) spectrometer