Materials Characterization https://www.dema.ufscar.br/en/institutional/multi-user-equipment/materials-characterization https://www.dema.ufscar.br/@@site-logo/dema-inteiro-branco-horizontal .svg Materials Characterization Scanning Electron Microscope - FEI Magellan 400 L Scanning Electron Microscope - FEI Inspect S 50 Scanning Electron Microscope - Philips XL-30 FEG Scanning Electron Microscope - Philips XL-30 TMP Transmission Electron Microscope - FEI TECNAI G² F20 HRTEM Transmission Electron Microscope - FEI TECNAI G2 S-TWIN Transmission Electron Microscope - Philips CM-120 Complete ASTAR system for orientation and phase mapping Confocal Microscope Atomic Force Microscope - Bruker Multimode 8 X-ray Diffractometer - Bruker D8 Advance ECO X-ray Diffractometer - Siemens D5005 X-ray Diffractometer - Rigaku Geiger-Flex Energy Dispersive X-ray Fluorescence Spectrometer Fourier-transform infrared (FT-IR) spectrometer X-ray fluorescence (XRF) spectrometer X-ray diffractometer (XRD) with small area accessory Benchtop Scanning Electronic Microscope (SEM)
