X-ray fluorescence (XRF) spectrometer

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Manufacturer and model: Rigaku, ZSX PRIMUS II

Description: The X-ray fluorescence allows the compositional analysis of vitreous and glass ceramics samples. This equipment can measure stoichiometry for elements from Boron, besides enabling compositional mapping of the sample. 

Acquisition funding: FAPESP (grant # 2016/04788-0)

Location: Vitreous Materials Laboratory (LaMaV)/DEMa

Booking contact: certevlamav@gmail.com