Scanning Electron Microscope - FEI Magellan 400 L

Manufacturer and model: FEI Magellan 400 L 

Description: The FEI Magellan 400 L is a high-resolution SEM-FEG (Field Emission Gun) that allows for sub-nanometric resolution. It has a microanalysis system by EDS (Energy Dispersive X-ray Spectroscopy) that allows quantification and chemical mapping. This microscope also has Transmission-Scan Electron Microscopy (STEM) detectors, which allow the analysis of thin samples. 

Acquisition funding: FAPESP

Location: Structural Characterization Laboratory (LCE)/DEMa

Booking contact: http://www.lce-dema.ufscar.br