Transmission Electron Microscope - FEI TECNAI G2 S-TWIN

Manufacturer and model: FEI TECNAI G2 S-TWIN

Description: The FEI TECNAI 52 S-TWIN is a TEM with a LaB6 filament that allows the conventional TEM imaging (brightfield, darkfield and diffraction) as well as high resolution images (HRTEM). This microscope is equipped with the Nanomegas ASTAR system, which allows phase mapping and automatic crystallographic orientation through the collection of precession electron diffraction patterns (Precession Electron Diffraction Pattern) and automatic indexing through the correlation of the collected patterns with the theoretical patterns of the analyzed phases.

Acquisition funding: CNPq, SisNano, LCE

Location: Structural Characterization Laboratory – LCE

Booking contact: http://www.lce-dema.ufscar.br