Scanning Electron Microscope - Philips XL-30 FEG

Manufacturer and model: Philips XL-30 FEG

Description: The Philips XL-30 FEG (Field Emission Gun) is a very versatile nanometer resolution SEM. This SEM has a modern EDS (Energy Dispersive X-ray Spectroscopy) system from Bruker that allows chemical microanalysis with fast chemical composition mapping. 

Acquisition funding: FAPESP

Location: Structural Characterization Laboratory (LCE)/DEMa

Booking contact: http://www.lce-dema.ufscar.br