Benchtop Scanning Electronic Microscope (SEM)

Manufacturer and model: JEOL, JCM 7000

Description: The benchtop Scanning Electronic Microscope (SEM) brand JEOL, model JCM 7000 with EDS accessory, is a compact device that performs chemical analysis in real time and simultaneously with image acquisition of the microstructure of the material to be investigated. Through some special functions (easy-to-use), this equipment allows the quick transition from optical microscopy images to scanning electron microscopy images, with higher resolution, providing clear images in both modes.

Acquisition funding: FAPESP

Location: Vitreous Materials Laboratory (LaMaV)/DEMa

Booking contact: certevlamav@gmail.com